Testing
Electrical characterization and reliability testing form a critical interface between the semiconductor world and the application environment a device was designed for. Developing a successful product requires a thorough understanding of this interface and a structured feedback for translating test results into improved designs.
We provide expertise across the entire testing chain, from end-of-line testing to switching waveform analysis and evaluation of device behavior within the target application.
A key strength of our approach is the ability to connect semiconductor device physics with application-level behavior. By combining a deep understanding of device physics, simulations, circuit analysis, and application engineering, we can efficiently identify root causes and develop effective solutions without lengthy trial-and-error investigations.
The example above illustrates a typical situation in which interactions between the semiconductor device, package or module parasitics, and the test setup result in unwanted switching oscillations. Understanding these interactions is essential for achieving optimal performance, robustness, and reliability.
Services
- Definition and optimization of end-of-line test concepts and test limits
- Evaluation of switching performance, including turn-off speed, turn-on controllability, switching losses, softness, and oscillation behavior
- Assessment and improvement of device ruggedness
- Root-cause analysis and debugging of unexpected test results
- Application support and custommer guidance
- Tester evaluation and iprovement
- Setup and evaluation of relibility test including pre and post stress testing strategies